| Model Type | Image Analysis |
|---|---|
| Framework | LiteRT (TensorFlow Lite) |
| Algorithm | CNN-based Classification |
| Technical Details | This application guides the user step by step through the process of training a custom model for defect detection. Designed to simplify model customization, it delivers visual feedback throughout the training journey. Optimized for real-time inference on edge. |
Image Analysis for Defect – Training Experience
AI-powered image analysis tool for defect detection in industrial environments, with a guided journey for customizing new defect types.
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Image Analysis for Defect – Training Experience
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